XPSpeak 4.45 software and analyze XPS data download unlimited

XPSpeak 4.45 software and analyze XPS data

XPSpeak is a free software program designed for fitting peaks in X-ray Photoelectron Spectroscopy (XPS) spectra, written by Raymund Kwok. Version 4.45 is a specific release of this software, offering features such as manually picking peak positions, fitting peaks with user-defined or built-in functions, and controlling the fitting process with bounds and constraints. 

How to Find and Download XPSpeak 

What is XPSpeak

XPSpeak (often version 4.1) is a Windows program for fitting peaks in XPS spectra. It supports background subtraction, peak addition, and other tools used in X-ray Photoelectron Spectroscopy analysis.

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Important cautions

• There doesn’t appear to be an official website hosting XPSpeak anymore.

• Many download links come from third-party software aggregator sites, which can be risky.

• Always verify the source, and scan downloaded files for viruses.

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How to find and download it

1. Software Informer – One of the more common places where XPSpeak 4.1 is listed as freeware. It’s usually provided as a portable application.

2. University pages – Some academic sites and labs previously hosted the installer or documentation. If you’re part of a university, you may be able to access it through departmental resources.

3. Documentation – Manuals exist online (for example, from University of Warwick) which can help once you obtain the program.

4. User videos/forums – YouTube tutorials and research forums sometimes share working download links.

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Alternatives if XPSpeak isn’t available

• KherveFitting – A free, open-source alternative recommended in XPS communities.

• UNIFIT – A professional package for XPS and AES data analysis, with academic licences available.

X-ray photoelectron spectroscopy (XPS) is one of the most used methods in a diverse field of materials science and engineering. The elemental core-level binding energies (BE) and core-level shifts (CLS) are determined and interpreted in the XPS.

 

Oxidation is commonly considered to increase the BE of the core electrons of metal and semiconductor elements (i.e., positive BE shift due to O bonds), because valence electron charge density moves toward electronegative O atoms in the intuitive charge-transfer model.

Here we demonstrate that this BE hypothesis is not generally valid by presenting XPS spectra and a consistent model of atomic processes occurring at HfO₂/InP interface including negative In CLSs. It is shown theoretically for abrupt HfO₂/InP model structures that there is no correlation between the In CLSs and the number of oxygen neighbors.

However, the P CLSs can be estimated using the number of close O neighbors. First native oxide model interfaces for III-V semiconductors are introduced. The results obtained from ab initio calculations and synchrotron XPS measurements emphasize the importance of complementary analyses in various academic and industrial investigations where CLSs are at the heart of advancing knowledge.